Nolot, E.: search on Z-Library

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1

Organisation, méthodes et recherches en archéologie criminalistique à l’Institut de recherche criminelle de la gendarmerie nationale. À propos de 20ans d’expérience

Ducrettet, F., Georges, P., Nolot, F., Richebé, J., Schuliar, Y.

Journal:

La Revue de Médecine Légale

Year:

2013

Language:

french

File:

PDF, 2.75 MB

french, 2013

2

Men Versus Chess Microcomputers in Paris

Journal:

Year:

1982

File:

PDF, 547 KB

1982

3

[IEEE 2015 IEEE 29th International Conference on Advanced Information Networking and Applications Workshops (WAINA) - Gwangiu, South Korea (2015.3.24-2015.3.27)] 2015 IEEE 29th International Conference on Advanced Information Networking and Applications Workshops - SDN Based Architecture for IoT and Improvement of the Security

Flauzac, Olivier, Gonzalez, Carlos, Hachani, Abdelhak, Nolot, Florent

Year:

2015

Language:

english

File:

PDF, 375 KB

english, 2015

4

Football et psychose

F. Nolot, C. Védie

Journal:

Annales Médico-psychologiques, revue psychiatrique

Year:

2008

Language:

french

File:

PDF, 158 KB

french, 2008

5

[IEEE GLOBECOM 2019 - 2019 IEEE Global Communications Conference - Waikoloa, HI, USA (2019.12.9-2019.12.13)] 2019 IEEE Global Communications Conference (GLOBECOM) - Is Mininet the Right Solution for an SDN Testbed?

Flauzac, Olivier, Gallegos Robledo, Erick Mauricio, Nolot, Florent

Year:

2019

File:

PDF, 4.27 MB

2019

6

[AIP CHARACTERIZATION AND METROLOGY FOR NANOELECTRONICS: 2007 International Conference on Frontiers of Characterization and Metrology - Gaithersburg, MD (27-29 March 2007)] AIP Conference Proceedings - Laser Scattering: a Fast, Sensitive, In-Line Technique for Advanced Process Development and Monitoring

Nolot, E., Arrazat, B., Favier, S., Borde, Y., Damlencourt, J. F., Vincent, B., Kermarrec, O., Carron, V., Nemouchi, F., Vandelle, P., Bogumilowicz, Y., Danel, A., Seiler, David G., Diebold, Alain C.,

Year:

2007

File:

PDF, 5.89 MB

2007

7

Optical metrology of thick photoresist process for advanced 3D applications

Nolot, E., André, A., Scibetta, C., Poulingue, M., Levin, L., Vignoud, L., Isselé, H.

Journal:

Thin Solid Films

Year:

2014

Language:

english

File:

PDF, 977 KB

english, 2014

8

Sub-Riemannian geometry and swimming at low Reynolds number: the Copepod case

Bettiol, P., Bonnard, B., Nolot, A., Rouot, J.

Journal:

ESAIM Control Optimisation and Calculus of Variations

Year:

2019

File:

PDF, 1.35 MB

2019

9

A review of native container security for running applications

Flauzac, Olivier, Mauhourat, Fabien, Nolot, Florent

Journal:

Procedia Computer Science

Year:

2020

File:

PDF, 285 KB

2020

10

Germanium, antimony, tellurium, their binary and ternary alloys and the impact of nitrogen: An X-ray photoelectron study

Nolot, E., Sabbione, C., Pessoa, W., Prazakova, L., Navarro, G.

Journal:

Applied Surface Science

Year:

2021

File:

PDF, 11.21 MB

2021

11

Fully depleted silicon on insulator MOSFETs on (1 1 0) surface for hybrid orientation technologies

T. Signamarcheix, F. Andrieu, B. Biasse, M. Cassé, A.-M. Papon, E. Nolot, B. Ghyselen, O. Faynot, L. Clavelier

Journal:

Solid-State Electronics

Year:

2011

Language:

english

File:

PDF, 667 KB

english, 2011

12

Sobolev estimates for optimal transport maps on Gaussian spaces

Fang, Shizan, Nolot, Vincent

Journal:

Journal of Functional Analysis

Year:

2014

Language:

english

File:

PDF, 456 KB

english, 2014

13

Cover crops mitigate nitrate leaching in cropping systems including grain legumes: Field evidence and model simulations

Plaza-Bonilla, Daniel, Nolot, Jean-Marie, Raffaillac, Didier, Justes, Eric

Journal:

Agriculture, Ecosystems & Environment

Year:

2015

Language:

english

File:

PDF, 1.95 MB

english, 2015

14

[IEEE 2018 IEEE International Reliability Physics Symposium (IRPS) - Burlingame, CA (2018.3.11-2018.3.15)] 2018 IEEE International Reliability Physics Symposium (IRPS) - Carbon electrode for Ge-Se-Sb based OTS selector for ultra low leakage current and outstanding endurance

Verdy, A., Navarro, G., Bernard, M., Chevalliez, S., Castellani, N., Nolot, E., Garrione, J., Noe, P., Bourgeois, G., Sousa, V., Cyrille, M.-C., Nowak, E.

Year:

2018

Language:

english

File:

PDF, 1.07 MB

english, 2018

15

Systematic combination of X-ray reflectometry and spectroscopic ellipsometry: A powerful technique for reliable in-fab metrology

E. Nolot, A. André

Journal:

Thin Solid Films

Year:

2011

Language:

english

File:

PDF, 590 KB

english, 2011

16

[IEEE Comput. Soc 14th International Parallel and Distributed Processing Symposium. IPDPS 2000 - Cancun, Mexico (1-5 May 2000)] Proceedings 14th International Parallel and Distributed Processing Symposium. IPDPS 2000 - Limits and power of the simplest uniform and self-stabilizing phase clock algorithm

Nolot, F., Villain, V.

Year:

2000

Language:

english

File:

PDF, 164 KB

english, 2000

17

Shock response spectrum analysis in running performance

Benjamin, D., Odof, S., Abbes, B., Nolot, J.B., Erre, D., Fourchet, F., Taiar, R.

Journal:

Computer Methods in Biomechanics & Biomedical Engineering

Year:

2020

File:

PDF, 748 KB

2020

18

Statistical characterization of acceleration levels of random vibrations during transport

S. Otari, S. Odof, J. B. Nolot, P. Vasseur, J. Pellot, N. Krajka, D. Erre

Journal:

Packaging Technology and Science

Year:

2011

Language:

english

File:

PDF, 757 KB

english, 2011

19

Iterative design and evaluation of rule-based cropping systems: methodology and case studies. A review

Philippe Debaeke, Nicolas Munier-Jolain, Michel Bertrand, Laurence Guichard, Jean-Marie Nolot, Vincent Faloya, Patrick Saulas

Journal:

Agronomy for Sustainable Development

Year:

2009

Language:

english

File:

PDF, 272 KB

english, 2009

20

Improvement of Capacitive Behavior on Gradient-Free PZT Thin Films

Pelloquin, Sylvain, Le Rhun, Gwenael, Defaÿ, Emmanuel, Renaux, Philippe, Nolot, Emmanuel, Abergel, Julie, Sibuet, Henri

Journal:

Integrated Ferroelectrics

Year:

2014

Language:

english

File:

PDF, 437 KB

english, 2014

21

[AIP CHARACTERIZATION AND METROLOGY FOR ULSI TECHNOLOGY 2005 - Richardson, Texas (USA) (15-18 March 2005)] AIP Conference Proceedings - Practical Applications of XRR-XRF Metrology Tool

Nolot, Emmanuel

Year:

2005

Language:

english

File:

PDF, 297 KB

english, 2005

22

Proposition of a New Severity Analysis Based on ‘Shake’ Detection: Example of the Vatry Airport Tarmac

Huart, Victor, Candore, Jean-Charles, Nolot, Jean-Baptiste, Krajka, Nicolas, Pellot, Jérôme, Odof, Serge, Erre, Damien

Journal:

Packaging Technology and Science

Year:

2015

Language:

english

File:

PDF, 4.35 MB

english, 2015

23

SPIE Proceedings [SPIE Optics & Photonics 2005 - San Diego, California, USA (Sunday 31 July 2005)] Advanced Characterization Techniques for Optics, Semiconductors, and Nanotechnologies II - In-line characterization of silicon nano-crystals grown on high-K tunnel dielectrics

Nolot, E., Duparr½Á, Angela, Singh, Bhanwar, Mur, P., Favier, S., Gu, Zu-Han

Year:

2005

Language:

english

File:

PDF, 586 KB

english, 2005

24

[untitled]

Review by: Édith Nolot

Journal:

Bulletin of the School of Oriental and African Studies

Year:

1998

Language:

english

File:

PDF, 330 KB

english, 1998

25

Accelerating the development of phaseâchange random access memory with inâfab plasma profiling timeâofâflight mass spectrometry

Nolot, Emmanuel, Mazel, Yann, Barnes, JeanâPaul, Sabbione, Chiara, Navarro, Gabriele, Tempez, Agnes, Legendre, SÃ©bastien

Journal:

Surface and Interface Analysis

Year:

2020

File:

PDF, 2.44 MB

2020

26

Phosphorus management in low input stockless cropping systems: Crop and soil responses to contrasting P regimes in a 36-year experiment in southern France

B. Colomb, P. Debaeke, C. Jouany, J.M. Nolot

Journal:

European Journal of Agronomy

Year:

2007

Language:

english

File:

PDF, 790 KB

english, 2007

27

200 mm Silicon On Porous Layer Substrates Made by the Smart Cut Technology for Double Layer-Transfer Applications

Stragier, A.-S., Signamarcheix, T., Salvetat, T., Nolot, E., Dechamp, J., Mercier, D., Gergaud, P., Tauzin, A., Clavelier, L., Lemiti, M.

Journal:

Journal of The Electrochemical Society

Year:

2011

Language:

english

File:

PDF, 2.03 MB

english, 2011

28

Developing a Distributed Software Defined Networking Testbed for IoT

Flauzac, Olivier, Gonzalez, Carlos, Nolot, Florent

Journal:

Procedia Computer Science

Year:

2016

Language:

english

File:

PDF, 205 KB

english, 2016

29

Football and psychosis

Nolot, Franck, Védie, Christian, Stewart, Alistair

Journal:

The Psychiatrist

Year:

2012

Language:

english

File:

PDF, 67 KB

english, 2012

30

[AIP ION IMPLANTATION TECHNOLOGY: 17th International Conference on Ion Implantation Technology - Monterey (California) (8–13 June 2008)] AIP Conference Proceedings - Evaluation of Laser Scattering Technique and Spectroscopic Ellipsometry for In-Line Ion Implantation Characterization

Milesi, F., Nolot, E., Mehrez, Z., Mazen, F., Favier, S., Seebauer, Edmund G., Felch, Susan B., Jain, Amitabh, Kondratenko, Yevgeniy V.

Year:

2008

Language:

english

File:

PDF, 1.79 MB

english, 2008

31

[IEEE 2016 16th International Workshop on Junction Technology (IWJT) - Shanghai, China (2016.5.9-2016.5.10)] 2016 16th International Workshop on Junction Technology (IWJT) - Metal/Insulator/Semiconductor contacts for ultimately scaled CMOS nodes: Projected benefits and remaining challenges

Borrel, Julien, Hutin, Louis, Grampeix, Helen, Nolot, Emmanuel, Tessaire, Magali, Rodriguez, Guillaume, Morand, Yves, Nemouchi, Fabrice, Gregoire, Magali, Dubois, Emmanuel, Vinet, Maud

Year:

2016

Language:

english

File:

PDF, 3.89 MB

english, 2016

32

X-ray reflectometry and grazing-incidence X-ray fluorescence characterization of innovative electrodes for tantalum-based resistive random access memories

Nolot, E., Caby, B., Gassilloud, R., Veillerot, M., Eichert, D.

Journal:

Spectrochimica Acta Part B: Atomic Spectroscopy

Year:

2018

Language:

english

File:

PDF, 1.52 MB

english, 2018

33

[IEEE 2019 IEEE 11th International Memory Workshop (IMW) - Monterey, CA, USA (2019.5.12-2019.5.15)] 2019 IEEE 11th International Memory Workshop (IMW) - Highly Sb-Rich Ge-Sb-Te Engineering in 4Kb Phase-Change Memory for High Speed and High Material Stability Under Cycling

Navarro, G., Sabbione, C., Bernard, M., Bourgeois, G., Sandrini, J., Castellani, N., Cueto, O., Garrione, J., Cyrille, M. C., Frei, M., Nistor, L., Bernier, N., Fillot, F., Nolot, E., Socquet-Clerc, C

Year:

2019

Language:

english

File:

PDF, 561 KB

english, 2019

34

[IEEE 2010 10th Annual International Conference on New Technologies of Distributed Systems (NOTERE) - Tozeur, Tunisia (2010.05.31-2010.06.2)] 2010 10th Annual International Conference on New Technologies of Distributed Systems (NOTERE) - Tree and cluster management for MANET

Flauzac, Olivier, Haggar, Bachar Salim, Nolot, Florent

Year:

2010

Language:

english

File:

PDF, 162 KB

english, 2010

35

Decomposition of the acceleration levels distribution of a road transport into a sum of weighted Gaussians: Application to vibration tests

Bonnin, Anne-Sophie, Nolot, Jean-Baptise, Huart, Victor, Pellot, Jérôme, Krajka, Nicolas, Odof, Serge, Erre, Damien

Journal:

Packaging Technology and Science

Year:

2018

Language:

english

File:

PDF, 1.75 MB

english, 2018

36

Characterization of CMOS sub-65 nm metallic contact by laser scattering: Thermal stability of Ni(Si1−xGex)

B. Arrazat, A. Danel, E. Nolot, S. Favier, V. Carron, F. Nemouchi, J.M. Hartmann, G. Rolland, P. Vandelle, O. Kermarrec, Y. Campidelli, S. Descombes

Journal:

Microelectronic Engineering

Year:

2007

Language:

english

File:

PDF, 522 KB

english, 2007

37

Changes in the concept of genotype

D. Desclaux, J. M. Nolot, Y. Chiffoleau, E. Gozé, C. Leclerc

Journal:

Year:

2008

Language:

english

File:

PDF, 255 KB

english, 2008

38

Thin film analysis by low-energy ion scattering by use of TRBS simulations

Brüner, Philipp, Grehl, Thomas, Brongersma, Hidde, Detlefs, Blanka, Nolot, Emmanuel, Grampeix, Helen, Steinbauer, Erich, Bauer, Peter

Journal:

Journal of Vacuum Science & Technology A Vacuum Surfaces and Films

Year:

2015

Language:

english

File:

PDF, 1.33 MB

english, 2015

39

ECS Transactions [ECS 218th ECS Meeting - Las Vegas, NV (October 10 - October 15, 2010)] - 200 mm Silicon on Porous Layer Substrates Made by the Smart Cut Technology for Double Layer Transfer Applications

Stragier, Anne-Sophie, Signamarcheix, Thomas, Salvetat, Thierry, Nolot, Emmanuel, Dechamp, Jero^me, Mercier, David, Gergaud, Patrice, Tauzin, Aurélie, Clavelier, Laurent, Lemiti, Mustapha

Year:

2010

Language:

english

File:

PDF, 721 KB

english, 2010

40

[AIP CHARACTERIZATION AND METROLOGY FOR NANOELECTRONICS: 2007 International Conference on Frontiers of Characterization and Metrology - Gaithersburg, MD (27-29 March 2007)] AIP Conference Proceedings - Thin Films Characterization by Ultra Trace Metrology

Danel, A., Nolot, E., Lhostis, S., Campidelli, Y., Calvo-Muñoz, M.-L., Decorps, T., Lardin, T., Veillerot, M., Kohno, H., Yamagami, M., Seiler, David G., Diebold, Alain C., McDonald, Robert, Garner,

Year:

2007

Language:

english

File:

PDF, 584 KB

english, 2007

41

XâRay Diffraction MicroâStrain Analysis for Extraction of Threading Dislocation Density of GaN Films Grown on Silicon, Sapphire and SiC Substrates

Yon, Victor, Rochat, NÃ©vine, Charles, Matthew, Nolot, Emmaunuel, Gergaud, Patrice

Journal:

physica status solidi (b)

Year:

2020

Language:

english

File:

PDF, 2.54 MB

english, 2020

42

Grain legume-based rotations managed under conventional tillage need cover crops to mitigate soil organic matter losses

Plaza-Bonilla, Daniel, Nolot, Jean-Marie, Passot, Sixtine, Raffaillac, Didier, Justes, Eric

Journal:

Soil and Tillage Research

Year:

2016

Language:

english

File:

PDF, 1.44 MB

english, 2016

43

Haiyan Hu-Von Hinüber: Das Po adhavastu: Vorschriften für diebuddhistische Beichtfeier im Vinaya der Mūlasarvāstivādins. (Studien zur Indologie und Iranistik, Monographie 13.) xix, 552 pp. Reinbek: Verlag fϋr Orientalistische Fachpublikationen, 1994.

Journal:

Bulletin of the School of Oriental and African Studies

Year:

1998

Language:

english

File:

PDF, 327 KB

english, 1998

44

[IEEE 2016 International Multidisciplinary Conference on Computer and Energy Science (SpliTech) - Split, Croatia (2016.7.13-2016.7.15)] 2016 International Multidisciplinary Conference on Computer and Energy Science (SpliTech) - SDN-based security framework for the IoT in distributed grid

Gonzalez, Carlos, Charfadine, Salim Mahamat, Flauzac, Olivier, Nolot, Florent

Year:

2016

Language:

english

File:

PDF, 335 KB

english, 2016

45

A novel 2-step ALD route to ultra-thin MoS 2 films on SiO 2 through a surface organometallic intermediate

CADOT, Stéphane, RENAULT, Olivier, Fregnaux, Mathieux, Rouchon, Denis, Nolot, Emmanuel, Szeto, Kai Chung, Thieuleux, Chloe, Veyre, Laurent, Okuno, Hanako, Martin, Francois, Quadrelli, Elsje Alessandra

Journal:

Year:

2016

Language:

english

File:

PDF, 3.18 MB

english, 2016

46

[IEEE 2016 IEEE Silicon Nanoelectronics Workshop (SNW) - Honolulu, HI, USA (2016.6.12-2016.6.13)] 2016 IEEE Silicon Nanoelectronics Workshop (SNW) - Considerations on fermi-depinning, dipoles and oxide tunneling for oxygen-based dielectric insertions in advanced CMOS contacts

Borrel, J., Hutin, L., Grampeix, H., Nolot, E., Ghegin, E., Rodriguez, P., Tabone, C., Allain, F., Barnes, J.-P., Morand, Y., Nemouchi, F., Gregoire, M., Dubois, E., Vinet, M.

Year:

2016

Language:

english

File:

PDF, 676 KB

english, 2016

47

Combining plasma profiling TOFMS with TOF-SIMS depth profiling for microelectronic applications

Tempez, Agnès, Legendre, Sébastien, Barnes, Jean-Paul, Nolot, Emmanuel

Journal:

Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures

Year:

2016

Language:

english

File:

PDF, 1.66 MB

english, 2016

48

[IEEE 2017 IEEE International Electron Devices Meeting (IEDM) - San Francisco, CA, USA (2017.12.2-2017.12.6)] 2017 IEEE International Electron Devices Meeting (IEDM) - Improvement of HfO2 based RRAM array performances by local Si implantation

Barlas, M., Grossi, A., Grenouillet, L., Vianello, E., Nolot, E., Vaxelaire, N., Blaise, P., Traore, B., Coignus, J., Perrin, F., Crochemore, R., Mazen, F., Lachal, L., Pauliac, S., Pellissier, C., Be

Year:

2017

Language:

english

File:

PDF, 1.15 MB

english, 2017

49

[IEEE 2017 28th Annual SEMI Advanced Semiconductor Manufacturing Conference (ASMC) - Saratoga Springs, NY, USA (2017.5.15-2017.5.18)] 2017 28th Annual SEMI Advanced Semiconductor Manufacturing Conference (ASMC) - Rapid, semi-quantitative depth profiling of ultra-thin films using plasma profiling time-of-flight mass spectrometry: AM: Advanced metrology

Mazel, Yann, Barnes, Jean-Paul, Nolot, Emmanuel, Tempez, Agnes, Legendre, Sebastien

Year:

2017

Language:

english

File:

PDF, 669 KB

english, 2017

50

Ellipsometry characterization of bulk acoustic wave filters

E. Nolot, A. Lefevre, J. N. Hilfiker

Journal:

physica status solidi (c)

Year:

2008

Language:

english

File:

PDF, 425 KB

english, 2008

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